Thin Solid Films, Vol.597, 57-64, 2015
Characterisation of electrodeposited polycrystalline uranium dioxide thin films on nickel foil for industrial applications
Polycrystalline uranium dioxide thin films were grown on nickel substrates via aqueous electrodeposition of a precursor uranyl salt. The arising semiconducting uraniumdioxide thin films exhibited a tower-like morphology, which may be suitable for future application in 3D solar cell applications. The thickness of the homogenous, tower-like films reached 350 nm. Longer deposition times led to the formation of thicker (up to 1.5 mu m) and highly porous films. (C) 2015 Elsevier B.V. All rights reserved.
Keywords:Uranium oxides;Thin films;Electrodeposition;X-ray diffraction;Scanning electron microscopy;Focused ion beam;Secondary ion mass spectrometry;High-speed atomic force microscopy