Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.15, No.21, 1898-1901, 1996 Export Citation Thickness Dependence of Crystalline Orientation in YBa2Cu3Ox Thin-Films Grown by Metalorganic Chemical-Vapor-Deposition Kang WN, Kim YH, Kim CH, Jang JW, Kim IT, Choi SS, Hahn TS Keywords:MICROSTRUCTURE;LAALO3;MOCVD Please enable JavaScript to view the comments powered by Disqus.
