Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.15, No.22, 1935-1937, 1996 DOI10.1007/BF00274341 Export Citation Development of Mechanical-Stress in Sputtered Cr3Si Films During Annealing Bruckner W, Weise G, Mattern N, Reiss G Keywords:THIN-FILMS;ELECTRICAL-PROPERTIES;STEEL Please enable JavaScript to view the comments powered by Disqus.
