Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.16, No.1, 1-3, 1997 DOI10.1023/A:1018521126248 Export Citation The Use of O1s Charge Referencing for the X-Ray Photoelectron-Spectroscopy of Al/Si, Al/Ti and Al/Zr Mixed Oxides Bhattacharya AK, Pyke DR, Reynolds R, Walker GS, Werrett CR Keywords:SURFACE;XPS Please enable JavaScript to view the comments powered by Disqus.
