The temporal bright and dark image sticking phenomena of the counter structure are compared with those of the coplanar structure. For both the counter and coplanar structures, the temporal bright and dark image sticking phenomena are examined by measuring the IR emission profile, displayed luminance, perceived luminance, and temperature. The bright image sticking and dark image sticking phenomena in the counter structure are lessened, because the influence on the MgO layer is reduced by the small sustain electrode area and the ion sputtering is not given directly damage to phosphor layer by parallel electric field between both sustain electrodes. Accordingly, the temporal bright and dark image sticking phenomena of the counter structure are mitigated.