Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.16, No.13, 1095-1098, 1997 DOI10.1023/A:1018555514784 Export Citation Atomic-Force Microscopy Studies of 2-Dimensional Epitaxial-Growth of Bi2Sr2-Xlaxcu6+delta Thin-Films Zhang YZ, Yang HT, Li L, Yang DG, Tao HJ, Zhao BR, Zhao ZX Keywords:SCANNING TUNNELING MICROSCOPY;MORPHOLOGY Please enable JavaScript to view the comments powered by Disqus.
