Thermally Triggered Degradation of Transient Electronic Devices

Park CW; Kang SK; Hernandez HL; Kaitz JA; Wie DS; Shin J; Lee OP; Sottos NR; Moore JS; Rogers JA; White SR

Advanced Materials, Vol.27, No.25, 3783-3788, 2015

DOI10.1002/adma.201501180 Export Citation

Thermally Triggered Degradation of Transient Electronic Devices

Park CW, Kang SK, Hernandez HL, Kaitz JA, Wie DS, Shin J, Lee OP, Sottos NR, Moore JS, Rogers JA, White SR

Thermally triggered transient electronics using wax-encapsulated acid, which enable rapid device destruction via acidic degradation of the metal electronic components are reported. Using a cyclic poly(phthalaldehyde) (cPPA) substrate affords a more rapid destruction of the device due to acidic depolymerization of cPPA.

Keywords:heat triggers;remote triggering;transient electronics;triggered degradation;wax encapsulation