Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.19, No.10, 903-905, 2000 DOI10.1023/A:1006758119723 Export Citation Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests Trtik P, Reeves CM, Bartos PJM Please enable JavaScript to view the comments powered by Disqus.
