Materials Research Bulletin, Vol.83, 563-567, 2016
Optical characteristics of multiple layered InGaN quantum wells on GaN nanowalls grown on Si (111) substrate
GaN nanowall crystals and InGaN multiple quantum wells (MQWs) were grown on Si (111) substrate using molecular beam epitaxy. In high N/Ga flux ratio, dense two dimensional network GaN nanowall structures were grown with small pores. The continuity of GaN nanowall structures was decreased as decreasing the N/Ga flux ratio. In the N/Ga flux ratio of 50, nanopillars and nanowalls were mixed. The InGaN MQWs were formed on the GaN nanowall crystals which were grown in the various N/Ga flux ratios. The strong photoluminescence originated from the InGaN MQWs on GaN nanowall crystals around a wavelength of 400 nm was observed at the temperatures from 8 K to 300 K (room temperature). The ratios of the photoluminescence intensities at 8 K and the room temperature were measured for the InGaN MQWs. The higher ratio was obtained as decreasing the N/Ga flux ratio of the GaN nanowall crystal growth. (C) 2016 Elsevier Ltd. All rights reserved.
Keywords:Nanostructures;Nitrides;Semiconductors;Epitaxial growth;Electron microscopy;X-ray diffraction