Nanoparticulate thin films of hematite with well-controlled thicknesses were prepared on transparent conductive substrates by a simple and tunable electrophoretic deposition method. Atomic force and scanning electron microscopy images reveal adherent, uniform, crack-free deposits comprised of clustered nanospheres with average diameters of 47 +/- 18 nm. An asymptotic relationship is observed between film thickness and deposition time for fixed voltages and particle concentrations, which enables facile reproducibility. The mild conditions of this method make it highly suitable for incorporation of hematite into multilayer thin-film assemblies that may comprise more sensitive materials (e.g., quantum dots).