Journal of Crystal Growth, Vol.454, 19-24, 2016
Coalescence of planar GaAs nanowires into strain-free three-dimensional crystals on exact (001) silicon
We report three dimensional (3D) disk-shaped GaAs crystals on V-groove patterned (001) Si substrates by metalorganic chemical vapor deposition. Planar GaAs nanowires with triangular cross-sections were grown inside Si V-grooves by nano-scale selective heteroepitaxy. These nanowires were then partially confined in micro-sized SiO2 cavities and coalesced into uniform arrays of 3D crystals. Scanning electron microscope and atomic force microscopy inspection showed the absence of antiphase-domains and smooth top surface morphology. Superior structural and optical properties over GaAs thin films on planar Si were also demonstrated. More remarkably, by growing the 3D crystals on V-grooved Si, we were able to overcome the residual tensile stress induced by the thermal mismatch between GaAs and Si. Strain free GaAs was uncovered in the crystals with a dimension of 3 x 3 mu m(2). (C) 2016 Elsevier B.V. All rights reserved.
Keywords:Defects;Stresses;Metalorganic chemical vapor deposition;Selective epitaxy;Semiconducting III-V materials;Semiconducting gallium arsenide