화학공학소재연구정보센터
Journal of Physical Chemistry, Vol.99, No.7, 2104-2109, 1995
High-Resolution TEM Imaging of Extreme Faulting in Natural Zeolite Tschernichite
High-resolution TEM images and electron diffraction patterns confirm the natural mineral tschernichite to be the topological equivalent to the important synthetic zeolite beta. Though crystallization under natural conditions is expected to lead to the formation of regular stacking of the layers, this natural zeolite mineral exhibits extremely high stacking fault frequencies. Such fault frequency is surprisingly equivalent to that of its synthetic counterpart. Compositional zoning, which could have occurred during hydrothermal genesis, was not observed. The crystals of natural tschernichite are embedded in a thin layer of cation deficient amorphous silica-alumina or clay which is proposed as the source of these elements for this zeolite’s nucleation and subsequent crystallization.