Materials Research Bulletin, Vol.87, 219-223, 2017
Variable range hopping and positive magnetoresistance in n type semiconductor CuIn3Se5
Variable range hopping mechanism of Mott type is observed for the first time in two different temperature ranges between 10K and 65 K in the ordered defect compound n-CuIn3Se5. Analysis of magnetic field dependence of positive magnetoresistance up to 27T that has been made at several temperatures up to 55K, shows B-2 and B-1/3 behavior in low and high field regions. This is in good agreement with the theory of Shklovskii-Efros for hopping conduction in lightly doped semiconductors. The field dependence of the localization temperature To and localization length is discussed. (C) 2016 Elsevier Ltd. All rights reserved.
Keywords:semiconductors;electronic materials;semiconductivity;X-ray diffraction;electrical properties;defects;electronic structure