A new spin-transfer torque (SIT) magnetic tunnel junction (MTJ) using an inverse magnetostriction (IMS) material for the free layer is proposed for low-voltage MRAMs. The MTJ is surrounded by a piezoelectric gate structure so that a pressure for introducing the IMS effect can efficiently be applied to the free layer without any high-yield-strength support structure. During SIT-induced magnetization switching, the energy barrier height for the switching can be lowered by the IMS effect, and thus a critical current density (J(C)) for the magnetization switching can dramatically be reduced. Energy performance of a low voltage SIT-MRAM cell using the proposed MTJ and a FinFET is also demonstrated. (C) 2016 Published by Elsevier Ltd.