Journal of Physical Chemistry, Vol.100, No.31, 13103-13120, 1996
Scanned Probe Microscopies in Chemistry
The theory and applications of scanned probe microscopies in chemistry are reviewed. The review includes scanning tunneling microscopy (STM), atomic force microscopy (AFM), near-field scanning optical microscopy (NSOM), and other related techniques. Applications to chemical and biochemical imaging, molecular identification, and other systems of importance in chemistry are described.
Keywords:ATOMIC-FORCE MICROSCOPY;CHARGE-DENSITY WAVES;SUBNANOMETER LATERAL RESOLUTION;ELECTRON-EMISSION SPECTROSCOPY;ORIENTED PYROLYTIC-GRAPHITE;LOW-DIMENSIONAL MATERIALS;NOBLE-METAL SURFACES;TUNNELING-MICROSCOPY;PHOTON-EMISSION;TUNNELLING MICROSCOPY