We studied the interaction of four different window layer combinations in Cu(In,Ga)Se-2 solar cells. Intrinsic ZnO (i-ZnO) layers were grown on CdS by either chemical vapor deposition (CVD) or magnetron sputtering. These were combined with sputtered ZnO:Al or In2O3:H grown by atomic layer deposition as transparent conducting oxides (TCO). It was found that the thickness of the CVD i-ZnO layer affects the open circuit voltage (V-oc) significantly when using In2O3:H as TCO. The V-oc dropped by roughly 30 mV when the i-ZnO thickness was increased from 20 to 160 nm. This detrimental effect on V-oc was not as prominent when a ZnO:Al TCO was used, where the corresponding decrease was in the range of 5 to 10 my. In addition, the V-oc drop for the CVD i-ZnO/In2O3:H structure was not observed when using the sputtered i-ZnO layer. Furthermore, large fill factor variations were observed when using the In2O3:H TCO without an i-ZnO layer underneath, where already a thin (20 nm) CVD i-ZnO layer mitigated this effect. Device simulations were applied to explain the experimentally observed Voc trends. (C) 2016 Elsevier B.V. All rights reserved.