This paper presents a study of optical and microstructural properties of the TiO2/316L, TiO2/Ti/316L and TiO2/Ti/glass interference systems obtained by gas injection magnetron sputtering technique (GIMS) employing a commercial magnetron line. The samples are examined by means of spectrophotometry, spectroscopic ellipsometry, confocal optical microscopy, X-ray photoelectron spectroscopy and atomic force microscopy. The investigation is completed by colorimetric analysis. Our analysis shows the significant differences in the color of samples with a TiO2 layer with the thickness of this layer in the range 30-35 nm. (C) 2017 Elsevier B.V. All rights reserved.