Journal of Crystal Growth, Vol.478, 9-16, 2017
Fast growth of n-type 4H-SiC bulk crystal by gas-source method
Fast growth of n-type 4H-SiC crystals was attempted using a high-temperature gas-source method. High growth rates exceeding 9 mm/h were archived at a seed temperature of 2550 degrees C, although the formation of macro-step bunching caused doping fluctuation and voids in the grown crystal. We investigated a trade-off between growth-rate enhancement and macro-step formation and how to improve the trade-off. By controlling the growth conditions, the growth of highly nitrogen-doped 4H-SiC crystals without the doping fluctuation and void formation were accomplished under a high growth rate exceeding 3 mm/h, maintaining the density of threading screw dislocations in the same level with the seed crystal. The influence of growth parameters on nitrogen incorporations into grown crystals was also surveyed. (C) 2017 Elsevier B.V. All rights reserved.
Keywords:Doping;Growth from vapor;Industrial crystallization;Single crystal growth;Semiconducting silicon compounds