We have investigated the space-charge-limited conduction (SCLC) in two different metal-insulator-metal junctions of the form: Au/BaTiO3 (BTO)/Nb:SrTiO3 (Nb:STO) and Au/BTO/La0.67Ca0.33MnO3 (LCMO) at various temperatures. The SCLC model has been employed to determine various parameters relevant to the charge conduction in these systems. While the trap density increases with decreasing temperature, the ratio of free to trapped carriers (theta) reduces for both the junctions, which can be understood as the thermally activated process. The extracted activation energies of 0.071 eV for Au/BTO/Nb:STO and 0.154 eV for Au/BTO/LCMO indicate the presence of shallow trap level. Moreover, the Fermi level at thermal equilibrium approaches the intrinsic limit with increasing temperature. Comparing both the junctions, we observe lower theta and deeper trap level in BTO/LCMO junction.