Transport properties of photo-induced charge carriers through different grains in the polycrystalline photovoltaic devices strongly depend on the microstructural pattern of the active layers. Therefore, photocurrent mapping with nanoscale resolution is important to know about the electrical responses of the different grains in the polycrystalline photovoltaic devices. Here, we have used photoconductive atomic force microscopy for mapping the photocurrent with nanoscale resolution of two types of ZnO nanorods/Cu2O based solar cells. The morphology and current have been measured simultaneously with nanoscale resolution from the top surfaces of the devices at different applied voltages. It is demonstrated that the nanostructure of the active layers is one of the most important variables determining device performances. Different local photovoltaic performances have been observed from these two devices due to various microstructural and electrical phenomena of their seed layers. On the other hand, significant variations in short-circuit current have been observed from different grains of the devices which appeared more alike in the micrograph owing to various transport properties of photo carriers. It is observed that the grain boundaries are more preferable for charge collection over the grain interiors. It shows a higher short circuit current close to the boundary than the grain inside. This study illustrates an important area for future fundamental research to enhance the performances of the polycrystalline photovoltaic devices through better control of morphology and improving the inherent properties of the active layers.