Chord length distribution (CLD) can be determined by an in-line measuring system with focused-beam reflectance measurement, but it can differ from crystal size distribution (CSD). However, expected values of CLD can be calculated from CSD by statistical methods and vice versa. In this study, a correlation equation between crystal size and aspect ratio during cooling crystallization was obtained and a mapping matrix was calculated based on the correlation equation. Then, the suspension obtained in cooling crystallization was sampled and CSDs were measured by microscopy at the same time that CLDs were measured with FBRM. As a result of error evaluation, transformation of CLD into CSD reduced the errors between CLDs and CSDs except in the early stage of crystallization.