Liquid poly(ethylene glycol) (molecular weight, -, 600 Da) with a low vapor pressure is used as droplets in an ultrahigh-vacuum X-ray photoelectron spectrometer (XPS) chamber with traditional electrowetting on dielectric (EWOD) device geometry. We demonstrate that, using XPS data, independent of the sign of the applied voltage, the droplet expands on the substrate with the application of a nonzero voltage and contracts back when the voltage is brought back to zero. However, the main focus of the present investigation is about tracing the electrical potential developments on and around the droplet, using the shifts in the binding energy positions of the core levels representative of the liquid and/or the substrate in an noninvasive and chemically specific fashion, under imposed electrical fields, with an aim of shedding light on numerous models employed for simulating EWOD phenomenon, as well as on certain properties of liquid/solid interfaces. While the lateral resolution of XPS does not permit to interrogate the interface directly, we explicitly show that critical information can be extracted by probing both sides of the interface simultaneously under external bias in the form of potential steps or direct current. We find that, even though no potential drop is observed at the metal-wire electrode/liquid interface, the entire potential drop develops across the liquid/solid-substrate interface, which is faster than our probe time window (similar to 100 ms) and is promptly complying with the applied bias until breakdown. No indication of band bending nor additional broadening can be observed in the C is peak of the liquid, even under electrical field strengths exceeding 10(7) V/m. Moreover and surprisingly, the liquid recovers within seconds after each catastrophic breakdown. All of these findings are new and expected to contribute significantly to a better understanding of certain physicochemical properties of liquid/solid interfaces.