In this study, we investigated on suppression of metal ions elution on dental orthodontic wire. To suppress metal ion elution from stainless wire, two types of surface chemical modifications were carried out. The obtained wire were immersed into several aqueous solution then the eluted ions (Cr and Ni, which are well known to cause a metal allergy) were determined using coupled plasma mass spectrometry (ICP-MS). By both electropolymerization and self-assembly monolayer formation, the ion elution was effectively reduced. These results suggested that these surface modifications succeeded to suppress the metal ions.