Widely-used complex plane analysis of impedance data is insufficiently sensitive to characterize fully the bulk properties of YSZ single crystal. Instead, more extensive data analysis is needed which uses a combination of parallel, admittance-based formalisms and series, impedance-based formalisms. Bulk electrical properties are measured at higher frequencies and contain contributions from both long range conduction and local dielectric relaxation. At lower frequencies, electrode-sample contact impedances are measured and are included in full equivalent circuit analysis. The impedance of YSZ crystal of composition 8 mol% Y2O3 in the (110) orientation, with Pt electrodes, was measured over the temperature range 150-750 degrees C and frequency range 0.01 Hz-3 MHz. Full data analysis required (i) a parallel constant phase element (CPE)-resistance (R) combination to model the electrode response, (ii) a series R-C element to represent local reorientation of defect dipoles and (iii) a R-C-CPE element to represent long range oxide-ion conduction; (ii) and (iii) together model the bulk response. The dielectric element underpins all discussions about defect structure and properties of YSZ but has not been included previously in analysis of impedance data. The new equivalent circuit that is proposed should allow better separation of bulk and grain boundary impedances of YSZ ceramics. (C) The Author(s) 2018. Published by ECS.