Journal of the American Chemical Society, Vol.120, No.49, 12882-12890, 1998
Neutron reflectivity determination of buried electroactive interface structure: PBT/PPy and PBT/PXV bilayers
Structure-property correlations of two electroactive polymer bilayers fabricated by different methods are investigated using neutron reflectivity to probe the buried polymer/polymer interfaces. Both bilayers utilize electropolymerized poly(2,2'-bithiophene) as an inner, mediating layer, while the outer layer consists of either electropolymerized polypyrrole or electroprecipitated polyxylylviologen, respectively. These devices have very different current-potential behaviors, which neutron reflectivity shows is a consequence of the fabrication method and the resulting polymer/polymer interfacial structure. The polybithiophene/polypyrrole film is found to be of composite structure while polybithiophene/polyxylylviologen forms a film comprised of segregated polymer layers.
Keywords:EMPLOYING CONDUCTING POLYMERS;SPECULAR REFLECTION;TRAPPINGREACTIONS;ELECTRODES;FILMS;SURFACES