A systematic study of the application of self-assembly monolayers (SAMs) onto electron and hole transporting layers for perovskite solar cells (PSCs) stability is reported. Cs(0.)(05)FA(0.83)MA(0.17)Pb(I0.87Br0.13)(3) (FMC) perovskite films were deposited onto tin oxide (SnO2) and nickel oxide (NiOx) layers that were functionalized with ethylphosphonic acid (EPA) and 4-bromobenzoic acid (BBA) SAMs. X-ray diffractometry measurements were performed on these films shortly after they were deposited. The diffractograms agree with the positions reported in the literature for the crystal structure of the FMC. The results show that the deposition of SAMs on the metal oxide layers yields positive improvements in the FMC film stability and in the device stability when using FMC as the active layer. The work shows that by adopting SAMs, the long-term stability of PSCs cells under accelerated test conditions can be enhanced, and this provides one step on the way to making this technology a commercial reality.