Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology A, Vol.13, No.3, 1267-1274, 1995 DOI10.1116/1.579872 Export Citation Depth Profiling Free Carbon in Silicon-Carbide Paulson TE, Bojan VJ, Wichterman BM, Pantano CG Keywords:MATRIX COMPOSITES;FIBER;MICROSTRUCTURE;SPECTROSCOPY;INTERFACE;SIMS Please enable JavaScript to view the comments powered by Disqus.
