Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology A, Vol.13, No.3, 1304-1309, 1995 DOI10.1116/1.579555 Export Citation Inelastic Mean Free Pathlengths of Electrons for Quantitative Investigations of Ultrathin Technological Surface-Layers by Angle-Resolved X-Ray Photoelectron Spectrometry Gries WH Keywords:FREE PATHS;ELASTIC-SCATTERING;XPS;AES;SPECTROSCOPIES Please enable JavaScript to view the comments powered by Disqus.
