Journal of Vacuum Science & Technology A, Vol.13, No.3, 1719-1727, 1995
Characterization of Silicon Surfaces and Interfaces by Optical Vibrational Spectroscopy
Keywords:REFLECTION ABSORPTION-SPECTROSCOPY;TERMINATED VICINAL SI(111);INFRARED-SPECTROSCOPY;HYDROGEN TERMINATION;SI(100)2X1 SURFACE;RELAXATION;OXIDE