This work details a systematic approach to finding optimum instrumental conditions for obtaining scanning tunneling microscope (STM) images from weakly bound adsorbates. In our laboratory, controlled bias ramping has been implemented on a modified Nanoscope III STM (Digital Instruments, Inc.) using a modified version of Digital’s Electrochemistry STM Software. The tip-to-sample bias is ramped under computer control over a specified voltage range at a programed rate. Simultaneously, the tunneling current is manually altered until the best image quality is obtained. The bias and setpoint, recorded as a function of total imaging time, are stored within the files of the captured images. The effect of these parameters on image quality can then be assessed off-line or postimaging. Controlled bias ramping has proved to be useful in studying molecular adsorbates, including linear alcohols and liquid crystals, deposited onto highly oriented pyrolytic graphite.