Exfoliated MoS2 thin films on titanium substrates have been investigated by scanning tunneling microscopy (STM) and spectroscopy (STS). Single layers of MoS2 Were placed on titanium substrates by an intercalation-exfoliation method. These layers consist of several hexagonal islands of surface atoms on the basal planes as well as axial planes with dangling bonds. The STS measurements showed a surface band gap value of 0.3 eV, which is lower than the value obtained on a single crystal of MoS2 (0.8 eV). Thus the differential conductivity measurements indicate that these films have a high density of states and conductivity due to the presence of a large number of axial lanes at the interface.