Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.2, 660-663, 1995 DOI10.1116/1.587935 Export Citation Interface Characterization in an InP/InGaAs Resonant-Tunneling Diode by Scanning-Tunneling-Microscopy Skala SL, Wu W, Tucker JR, Lyding JW, Seabaugh A, Beam EA, Jovanovic D Keywords:GROWTH;SUPERLATTICES;DIFFRACTION;GAAS Please enable JavaScript to view the comments powered by Disqus.
