Previous Article Next Article Table of Contents Journal of Vacuum Science & Technology B, Vol.13, No.3, 1265-1267, 1995 DOI10.1116/1.587835 Export Citation Atomically Resolved Image of Cleaved Surfaces of Compound Semiconductors Observed with an Ultrahigh-Vacuum Atomic-Force Microscope Ohta M, Sugawara Y, Osaka F, Ohkouchi S, Suzuki M, Mishima S, Okada T, Morita S Keywords:INP 110;RESOLUTION;MECHANISM Please enable JavaScript to view the comments powered by Disqus.
