Journal of Vacuum Science & Technology B, Vol.14, No.2, 864-867, 1996
Driven Nonlinear Atomic-Force Microscopy Cantilevers - From Noncontact to Tapping Modes of Operation
A numerical model of the operation of an atomic force microscope with a driven cantilever is presented. This model takes into account the attractive van der Waals and repulsive indentation forces acting between tip and sample. The time-dependent displacement amplitude and phase of the tip oscillations. and the magnitude, duration, and sign of the short bursts of tip-sample force are derived. It is shown that the stiffness of the tip and sample materials is an important factor in determining the magnitude and duration of the tip-sample repulsive force and the magnitude of sample indentation. The model covers typical operating ranges of vibrating cantilever atomic force microscopes, from the noncontact to the tapping modes.