It is known that scanning probe image data are distorted by the geometry of the probe and its interaction with the sample. Here, we describe the application of a new method for obtaining information on tip shape from scanning probe topographic image without a priori assumptions of tip or sample geometry. The results obtained from image data acquired from polymeric and semiconductor samples indicate that-this tip information is distorted by the interaction between the imaging probe and the sample surface. Analysis of a series of data, acquired at different, scan speeds and forces, reveals the complex relationship between these associative phenomena and demonstrate that new methods for scanning probe surface reconstruction are required.