This paper embodies the first report on the electrochemical deposition of RuS2 thin films. The as-deposited and heat-treated films (in argon atmosphere) were characterized by XRD, SEM and UV-VIS-NIR spectrophotometry. The polycrystalline deposits of RuS2 obtained indicated a cubic structure with a lattice constant of 5.685 Angstrom, an average grain size around 3 mu m, and an absorption coefficient of 5 x 10(4) cm(-1). The optical band gap was found to be 1.48 eV.