A relatively non-invasive imaging technique, which employs highly focused, tunable X-rays, is described. This technique-scanning transmission X-ray microscopy-can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present examples ranging from unoriented multiplase polymers to highly oriented Kevlar fibres. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of bulk samples is discussed.