A new method has been developed for the analysis of domain morphology of stained polyolefin blends by low voltage scanning electron microscopy (LVSEM). The component polymers of the blend are differentiated by heavy staining with RuO4. LVSEM at low accelerating voltages provides high resolution imaging and minimal beam damage to the sample. The method is routinely applied to the analys sis of domain morphology in moulded samples, fibres and films, to failure analysis and to the analysis of layer morphology of co-extruded films.