Different dopant salt (AgI) compositions in the AgI-Ag2O-SeO2-V2O5 (SSV) system were prepared by the melt quenching technique. All the prepared compositions of the SSV system were characterized by X-ray diffraction, IR and DSC. The electrical conductivity measurements were made on the various dopant salt contents of SSV glasses at 1 KHz as well as a function of frequency (5 Hz to 13 MHz) and temperature (295-323 K). The true bulk conductivity (sigma(e) = 2.61 x 10(-2) S/cm) and the electrical behavior (equivalent circuit) of the SSV glassy system were obtained from impedance analysis. The variation of conductivity with the AgI content in the SSV system was explained using the diffusion path model. Also, frequency dependence of dielectric constant (epsilon) and conductivity (sigma) were calculated using the impedance data, obtained for the various AgI contents of the SSV system. The variation of dielectric constant and conductivity with the frequency were explained by correlating the microscopic nature of the ionic conduction process in the SSV system. (C) 2000 Elsevier Science B.V. All rights reserved.