Surfaces of the layered dichalcogenide tungsten diselenide (WSe2) were investigated on the atomic scale by atomic force microscopy. On (0001) surfaces, lattice resolution was obtained. The observed hexagonal symmetry of the lattice as well as the lattice constant of 0.33 +/- 0.01 nm are in good agreement with the crystal structure. By applying low normal forces of approximately 3 nN and a low time constant of the feedback loop, it was possible to avoid atomic-scale stick-slip processes and achieve a continuous sliding of the cantilever tip on the sample, allowing an analysis of the atomic profiles. From the experimental data, a maximum value of the lateral forces between the tip and the sample during scanning of 2 nN was determined. Smooth atomic profiles were observed with corrugations between 0.2 and 0.3 nm, which indicate the influence of elastic tip-sample interactions on the imaging process.