This paper reports the microstructural investigations of a newly developed textured black brass selective surface. The scanning electron microscopy analysis reveals that it consists of loosely packed grains. The grains are of the order of 0.05-0.1 mu m in size. The surface is inhomogeneous and has a roughness similar to 0.1 mu m. The metallic grains are dispersed in a semiconductor oxide matrix. The spacings between the grains are of the order of the solar wavelength. Diffraction pattern analysis of the as-deposited and the air-annealed black brass selective surface have also been performed.