Thin Solid Films, Vol.276, No.1-2, 73-75, 1996
Excitation Wavelength Dependence of Raman and Photoluminescence Spectra of Porous Si Membranes
A frequency shift and a band narrowing of the Raman and photoluminescence (PL) spectra from porous Si free-standing films are observed with increasing excitation wavelength. We attribute this to a distribution of particle size in Si nanostructures. From the PL and Raman band shapes we determine the energy gap distribution and particle size in Si nanostructures.
Keywords:SILICON