C-60 thin films were thermally evaporated onto mica(001) substrates at a temperature of 200 degrees C and a deposition rate of 0.5 Angstrom s(-1). The 2500 Angstrom thick films were studied using high-voltage transmission electron microscopy (HVTEM) and electron diffraction. Oriented growth of C-60 on mica with C-60(111)parallel to mica(001) was observed as well as twin formation about the three <[11(1)over bar ]> axes. The observed orientation relationships are discussed on the basis of structural considerations.