Pure Ti films were produced by two-facing-target-type DC sputtering under various preparation conditions such as sputtering gas pressure, substrate temperature and film thickness, and their microstructures were investigated by both X-ray diffractometry and scanning electron microscopy. The microstructures were explained well in terms of structure zone, based on the Thomton’s model concerning the morphology in sputtered films. It is also shown that a one-to-one correspondence does not always exist between columnar structure and preferred orientation.