화학공학소재연구정보센터
Thin Solid Films, Vol.281-282, 580-583, 1996
Simulation of Atomic-Force Microscopy Image Variations Due to Tip Apex Size - Appearance of Half Spots
Using a recently developed atomic force microscopy (AFM) simulator ACCESS (AFM simulation Code for Calculating and Evaluating Surface Structures), effects of tip apex size on AFM images were examined. A metal tip-metal sample system consisting of iron tip and copper sample was employed as a model system. Structures with half the surface periodicity, which have been observed in actual AFM measurements, were observed at certain tip apex registries. Conditions for their appearances were examined.