화학공학소재연구정보센터
Thin Solid Films, Vol.297, No.1-2, 73-78, 1997
Characterization of Freeze-Dried Porous Silicon
The first characterisation results on freeze-dried porous silicon are reported. The freeze drying process is shown to be highly non-destructive. The samples so far obtained on substrates with different doping density show better morphological, optical and photoluminescence properties. The first structural information on freeze-dried PS have been obtained by Raman and transmission electron microscopy techniques. Compared with other drying techniques, freeze drying appears to be a simple and contamination-free method.