The structure and magnetic properties of Co/Cu multilayers, grown on a float glass, in a molecular beam epitaxy (MBE) system are discussed. Structural characterization of samples was performed in-situ by means of a reflection high-energy electron diffraction (RHEED) and Auger electron spectroscopy (AES), as well as ex-situ by X-ray reflectometry. For the first time, we show successful analysis of layered structure of metallic multilayers by scanning tunneling microscopy (STM). Magnetization and in-plane magnetoresistance were measured as functions of Co and Cu sublayer thicknesses. The evidences of oscillatory coupling of magnetic sublayers with varying thicknesses of nonmagnetic spacer are presented. Co/Cu multilayers also display giant magnetoresistance (GMR) effect. The influence of buffer layer roughness on GMR is clearly shown.