The morphology of silver films grown at 300 degrees C in high vacuum have been characterized. The films consist of highly ordered (100) oriented grains exhibiting large flat terraces with array of parallel steps. The surface roughness of the individual grains was characterized by scanning tunnelling microscopy (STM) in terms of height histograms and height-height correlations. The results are discussed in the context of applications of these films as templates for the investigation of complex molecules.