Thin Solid Films, Vol.318, No.1-2, 201-203, 1998
Temperature and thickness dependent epitaxial relationship of Pd(111) on Cr(110)
Considering only the atomic diameter ratio, a Kurdjumov-Sachs (KS) in-plane epitaxial relationship between Pd(lll) and Cr(110) appears to be favored. However, depending up on growth temperature and film thickness we obtain both Nishiyama-Wassermann (NW) and KS orientations. This was found by surface X-ray scattering as well as from LEED experiments. The two orientations can be distinguished by the number of in-plane domains which is one for NW and two for KS. The samples were grown by MBE. During the Pd growth, we observe a continuous transition from the KS to the NW relationship, which is accompanied by a major reorientation of material. Qualitative considerations concerning the Pd island structure, which develops during growth, explain the observed behavior. The thickness-temperature dependence of the different epitaxial orientations has been determined in a phase diagram.