The object of the present paper is to describe the morphological and crystalline characteristics of ZnS:Mn thin films grown on different low melting point metallic substrates such as Pb, Bi and Bi(1-x)Sbx alloys by a new method based on the quasi-rheotaxy technique. In this paper we also prove that the quasi-rheotaxy deposition technique yields high quality ZnS:Mn thin films without the so called dead layer and without the conical pattern typical of the most common deposition techniques.